Services

Focused Ion Beam (FIB)

What sets AMS FIB services apart from other labs is the quality and expertise of our FIB engineers. That means higher quality results in a shorter period of time, which ultimately translates to lower cost of service.

Process Analysis and Verification

• Photo resist & metal profiles
• Critical dimensions
• Feature overlay
• Defect analysis
• Particle inclusion
• Voids, cracks, fissures
• Delaminating
• Process interaction
• Micro-surgery

Read how AMS expert FIB engineers solved one customer's problem.

One Analytical Services customer came to AMS needing a quick turnaround in order to proceed to the next level of his statistically designed experimentation. Working in an accelerated mode, AMS FIB engineers provided the required grain structure analysis of plated metal structures in less than four days. With the information he received from AMS, the customer proceeded to the next level experiment weeks ahead of the timeframe that would have been necessary had he used his previous analytical house. With this kind of turnaround, the AMS Analytical Services customer can ensure a higher quality process and accelerate his time to market.